• DocumentCode
    2758544
  • Title

    Ac and transient electric field distributions along a 380 kV V-string insulator

  • Author

    Ilhan, Suat ; Ozdemir, Aydogan ; Jayaram, Shesha H. ; Cherney, Edward A.

  • Author_Institution
    Dept. of Electr. Eng., Istanbul Tech. Univ., Istanbul, Turkey
  • fYear
    2012
  • fDate
    10-13 June 2012
  • Firstpage
    399
  • Lastpage
    403
  • Abstract
    This paper presents the results of a study of the ac and the transient electric field distributions along a 380 kV V-string of glass cap-and-pin suspension insulators. The transmission tower, conductors and insulators are modeled in 3D, and COMSOL 4.2 is used for the finite element simulations. The insulators are modeled both for clean and for the polluted cases. The pollution layer is modeled by a wet conductive layer of 2 mm thickness on the insulator surface and the conductivity of the layer is varied between 10-8 to 1.0 S/m. The permittivity of the pollution layer is assumed to be 81. Clean, full pollution and partial pollution cases are taken into consideration. The effects of corona rings on the field distributions are also investigated by 3D simulations.
  • Keywords
    conductors (electric); corona; finite element analysis; insulator contamination; poles and towers; power engineering computing; 3D model; 3D simulations; AC field distribution; COMSOL 4.2; V-string insulator; conductors; corona rings; finite element simulations; full-pollution case; glass cap-and-pin suspension insulators; insulator surface; partial-pollution case; pollution layer permittivity; transient electric field distribution; transmission tower; voltage 380 kV; wet conductive layer; Conductivity; Corona; Electric fields; Electric potential; Insulators; Pollution; Surface contamination; 380 kV; Corona rings; FEM; electric field distributions; impulse voltage; insulator string; pollution; potential distributions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation (ISEI), Conference Record of the 2012 IEEE International Symposium on
  • Conference_Location
    San Juan, PR
  • ISSN
    1089-084X
  • Print_ISBN
    978-1-4673-0488-7
  • Electronic_ISBN
    1089-084X
  • Type

    conf

  • DOI
    10.1109/ELINSL.2012.6251498
  • Filename
    6251498