DocumentCode :
2758797
Title :
Texture or Color Analysis in Agronomic Images for Wheat Ear Counting
Author :
Cointault, F. ; Gouton, P.
Author_Institution :
Enesad, UP GAP, Quetigny
fYear :
2007
fDate :
16-18 Dec. 2007
Firstpage :
696
Lastpage :
701
Abstract :
In agronomy, image processing techniques are more and more used to detect crop, weeds, diseases ... We proposed to study the feasibility to use color and/or texture analysis to evaluate the number of wheat ears per m2 to simplify the manual countings currently done. In this paper we present firstly the use of color and texture image processing together to detect the ears, before to propose and compare different texture image segmentation techniques based on feature extraction by first and higher order statistical methods. The extracted features are used for unsupervised pixel classification to obtain the different classes in the image, before to use the k-means algorithm. Three methods have been tested with very heterogeneous results, except the run length technique for which the results are close to the manual countings (66% error). The hypothesis took into account for the textural analysis methods are currently modify to justify them more accurately, especially concerning the number of classes and the size of the analysis window.
Keywords :
agriculture; crops; feature extraction; image classification; image colour analysis; image segmentation; image texture; object detection; statistical analysis; agronomic images; color analysis; ear detection; feature extraction; image processing; image segmentation; k-means algorithm; statistical method; texture analysis; unsupervised pixel classification; wheat ear counting; Crops; Diseases; Ear; Feature extraction; Image analysis; Image color analysis; Image processing; Image segmentation; Image texture analysis; Statistical analysis; agronomy; color; image processing; texture;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal-Image Technologies and Internet-Based System, 2007. SITIS '07. Third International IEEE Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-0-7695-3122-9
Type :
conf
DOI :
10.1109/SITIS.2007.80
Filename :
4618841
Link To Document :
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