DocumentCode :
2758873
Title :
Growth and characterization of AlGaInN for UV optoelectronics
Author :
Han, Jung ; Crawford, Mary H. ; Numrikko, A.V.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
557
Abstract :
Several issues related to the growth of nitride-based UV light emitters will be discussed in this work. In contrast to the widely pursued, InGaN-based, blue LEDs, UV LEDs mandates the use of an active layer of little or no indium. To provide comparable level of electrical and optical confinement, one has to employ ternary AlGaN with a higher fraction of Al and an increased thickness. Two issues which will be addressed in the talk, therefore, are the role of indium in GaN:In and AlGaN:In heterostructures for UV emission, and the control of grown-in strain (due to tensile mismatch between AlGaN and GaN) using a compliant interlayer to avoid cracking. Finally, we will summarize the results of various exploratory UV optoelectronic devices
Keywords :
III-V semiconductors; X-ray diffraction; aluminium compounds; gallium compounds; light emitting diodes; photoluminescence; semiconductor quantum wells; AlGaInN UV optoelectronics; AlGaN:In; AlGaN:In heterostructures; GaN:In; InGaN-based, blue LEDs; UV LEDs; UV optoelectronic devices; active layer; compliant interlayer; grown-in strain; nitride-based UV light emitters; optical confinement; tensile mismatch; ternary AlGaN; Artificial intelligence; Brightness; Coatings; Gallium nitride; Light emitting diodes; Optical detectors; Optical devices; Photonic band gap; Quantum well devices; Stimulated emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE
Conference_Location :
Rio Grande
ISSN :
1092-8081
Print_ISBN :
0-7803-5947-X
Type :
conf
DOI :
10.1109/LEOS.2000.893963
Filename :
893963
Link To Document :
بازگشت