• DocumentCode
    2758873
  • Title

    Growth and characterization of AlGaInN for UV optoelectronics

  • Author

    Han, Jung ; Crawford, Mary H. ; Numrikko, A.V.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    557
  • Abstract
    Several issues related to the growth of nitride-based UV light emitters will be discussed in this work. In contrast to the widely pursued, InGaN-based, blue LEDs, UV LEDs mandates the use of an active layer of little or no indium. To provide comparable level of electrical and optical confinement, one has to employ ternary AlGaN with a higher fraction of Al and an increased thickness. Two issues which will be addressed in the talk, therefore, are the role of indium in GaN:In and AlGaN:In heterostructures for UV emission, and the control of grown-in strain (due to tensile mismatch between AlGaN and GaN) using a compliant interlayer to avoid cracking. Finally, we will summarize the results of various exploratory UV optoelectronic devices
  • Keywords
    III-V semiconductors; X-ray diffraction; aluminium compounds; gallium compounds; light emitting diodes; photoluminescence; semiconductor quantum wells; AlGaInN UV optoelectronics; AlGaN:In; AlGaN:In heterostructures; GaN:In; InGaN-based, blue LEDs; UV LEDs; UV optoelectronic devices; active layer; compliant interlayer; grown-in strain; nitride-based UV light emitters; optical confinement; tensile mismatch; ternary AlGaN; Artificial intelligence; Brightness; Coatings; Gallium nitride; Light emitting diodes; Optical detectors; Optical devices; Photonic band gap; Quantum well devices; Stimulated emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE
  • Conference_Location
    Rio Grande
  • ISSN
    1092-8081
  • Print_ISBN
    0-7803-5947-X
  • Type

    conf

  • DOI
    10.1109/LEOS.2000.893963
  • Filename
    893963