Cu internal electrode multilayer ceramic capacitor

Author

Hakotani, Yasuhiko ; Nakatani, Seiichi ; Yuhaku, Satoru ; Nishimura, Tsutomu ; Ishida, Toru

Author_Institution

Matsushita Electr. Ind. Co. Ltd., Osaka, Japan

fYear

1989

fDate

26-28 Apr 1989

Firstpage

152

Lastpage

155

Abstract

The authors have developed a process for the manufacture of a multilayer ceramic capacitor with copper internal electrodes (CuMLC). The method employs low-firing-temperature Pb(Mg_1/3Nb_2/3)Cu_0.01O_3.01 and copper oxide paste as dielectric and conductive materials, respectively. The organic binder is burned out in air, and this step is followed by reduction of copper oxide and sintering. The following electrical properties of CuMLC were obtained: dielectric constant: 11000; dissipation factor at 1 kHZ, 1 Vrms 0.5%; insulation resistance: >10000 ΩF (at 25°C). In the load humidity test (85°C, 85% RH, 50 V), no degradation of insulation resistance was found during 1000 h of testing

Keywords

capacitors; permittivity; sintering; CuO; PbCuMgO₃NbO₃; conductive materials; dielectric constant; dissipation factor; electrical properties; firing temperature; insulation resistance; load humidity test; multilayer ceramic capacitor; organic binder; sintering; Capacitors; Ceramics; Copper; Dielectrics and electrical insulation; Electric resistance; Electrodes; Insulation testing; Manufacturing processes; Niobium; Nonhomogeneous media;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Manufacturing Technology Symposium, 1989, Proceedings. Japan IEMT Symposium, Sixth IEEE/CHMT International

Conference_Location

Nara

Type

conf

DOI

10.1109/IEMTS.1989.76127

Filename

76127