• DocumentCode
    2758957
  • Title

    A novel double sampling technique for delta-sigma modulators

  • Author

    Yang, Hong-Kui ; El-Masry, Ezz I.

  • Author_Institution
    Dept. of Electr. Eng., Tech. Univ. Nova Scotia, Halifax, NS, Canada
  • Volume
    2
  • fYear
    1994
  • fDate
    3-5 Aug 1994
  • Firstpage
    1187
  • Abstract
    The double sampling technique is used to achieve twice the sampling frequency in sampled-data systems without extra requirements (e.g., clock rate, op-amp settling time, op-amp dc gain, etc.). In this paper, theoretical analyses of the effects of nonidealities (integrator leakage, path gain mismatch and non-uniform sampling) on the performance of double sampling delta-sigma modulators (ΔΣM´s) are given. A novel double sampling technique for ΔΣM´s which is insensitive to the path gain mismatch is also presented. This technique uses a bilinear integrator in the first stage, resulting in a first order shaping of the path gain mismatch error. Compared with a second-order single sampling ΔΣM, this technique is able to achieve 15 dB improvement of S/N and 6 dB relaxation of op-amp dc gain
  • Keywords
    sampled data circuits; sigma-delta modulation; signal sampling; bilinear integrator; delta-sigma modulators; double sampling; integrator leakage; nonidealities; nonuniform sampling; op-amp DC gain relaxation; path gain mismatch error; sampled-data systems; signal noise ratio; Bandwidth; Capacitors; Clocks; Data systems; Delta modulation; Frequency; Operational amplifiers; Performance analysis; Performance gain; Sampling methods; Signal to noise ratio; Silicon compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1994., Proceedings of the 37th Midwest Symposium on
  • Conference_Location
    Lafayette, LA
  • Print_ISBN
    0-7803-2428-5
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1994.519021
  • Filename
    519021