DocumentCode :
2759087
Title :
Behaviour Pattern-Based Model Generation for Model-Based Testing
Author :
Kanstren, Teemu
Author_Institution :
VTT Tech. Res. Centre of Finland, Finland & Delft Univ. of Technol., Oulu, Finland
fYear :
2009
fDate :
15-20 Nov. 2009
Firstpage :
233
Lastpage :
241
Abstract :
This paper presents the concept of using behavioral pattern mining to generate models for model-based testing. These patterns are mined from observations captured from execution scenarios of the system under test, and the different patterns are combined in order to provide a suitable higher level model for model-based testing. The concept is first discussed on a general level, providing a basis for implementation of semi-automated model generation algorithms based on combinations of different behavioral patterns. This concept is illustrated by showing how to generate extended finite state machine models in a format suitable for model-based testing. The generated model is further validated by applying it for model-based testing of a real software component, where it reveals actual faults in the system under test. In addition to the benefits, the discovered limitations of the approach are discussed. Future work is discussed as potential means to address these limitations.
Keywords :
data mining; finite state machines; program testing; software performance evaluation; behavioral pattern mining; behavioral patterns combination; behaviour pattern based model generation; finite state machine model; model based testing; semi automated model generation algorithm; system under test; Automatic testing; Monitoring; Paper technology; Power generation; Power system modeling; Programming; Runtime; Software testing; System testing; Test pattern generators; behavioral patterns; model generation; model-based testing; pattern mining;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Future Computing, Service Computation, Cognitive, Adaptive, Content, Patterns, 2009. COMPUTATIONWORLD '09. Computation World:
Conference_Location :
Athens
Print_ISBN :
978-1-4244-5166-1
Electronic_ISBN :
978-0-7695-3862-4
Type :
conf
DOI :
10.1109/ComputationWorld.2009.10
Filename :
5359589
Link To Document :
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