Dielectric relaxation spectroscopy of epoxy resins with TiO2, Al2O3, WO3 and SiO2 nanofillers

Author

Klampar, Marian ; Liedermann, Karel

Author_Institution

Dept. of Phys., Brno Univ. of Technol., Brno, Czech Republic

fYear

2012

fDate

10-13 June 2012

Firstpage

637

Lastpage

640

Abstract

The subject of this study is dielectric properties of a four-component casting epoxy resin containing TiO₂, Al₂O₃, WO₃ and SiO₂ nanofillers over the frequency range 20 Hz - 1 MHz with the aim to investigate the possibilities of using dielectric spectroscopy for diagnostics of such nanocomposites or structures constructed of them. Both positive and negative features of nanofillers in the epoxy resin are examined. The paper explains how to prepare samples for dielectric measurements, then proceeds with the presentation of results themselves before arriving to interpretations.

Keywords

aluminium compounds; dielectric measurement; dielectric relaxation; silicon compounds; spectroscopy; titanium compounds; tungsten compounds; Al₂O₃; SiO₂; TiO₂; WO₃; diagnostics; dielectric properties; dielectric relaxation spectroscopy; dielectric spectroscopy; epoxy resins; four-component casting epoxy; frequency 20 Hz to 1 MHz; nanocomposites; nanofillers negative features; nanofillers positive features; structures; Casting; Conductivity; Dielectric measurements; Dielectrics; Epoxy resins; Nanocomposites; Al2O3; SiO2; TiO2; WO3; dielectrics; epoxy resin; fillers; nanocomposites;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation (ISEI), Conference Record of the 2012 IEEE International Symposium on

Conference_Location

San Juan, PR

ISSN

1089-084X

Print_ISBN

978-1-4673-0488-7

Electronic_ISBN

1089-084X

Type

conf

DOI

10.1109/ELINSL.2012.6251549

Filename

6251549