DocumentCode :
2759602
Title :
Measurements of conductivity of thin gold films at microwave frequencies employing resonant techniques
Author :
Zychowicz, Tomasz ; Krupka, Jerzy ; Mazierska, Janina
Author_Institution :
Univ. of Technol., Warsaw
fYear :
2006
fDate :
12-15 Dec. 2006
Firstpage :
572
Lastpage :
574
Abstract :
Quasi TE011 mode cavity and split post dielectric resonator have been used to measure resistivity of very thin gold films deposited on single crystal quartz substrates. It has been found that a sharp transition of electrical properties takes place for films of thickness between from 4.5 nm and 8 nm. For the films thicker than 8 nm the resistivity was comparable to that of bulk materials, and its dependence on film thickness could be described by known theoretical models, while for films thinner than 4.5 nm the resistivity was few orders of magnitude larger. Presented techniques allow measurements of resistivity of thin films in the eight decades range.
Keywords :
dielectric resonators; electrical conductivity measurement; gold; metallic thin films; microwave measurement; Au; SiO2; conductivity measurement; microwave frequencies; quasi TE011 mode cavity; resonant techniques; single crystal quartz substrates; split post dielectric resonator; thin gold films; Conductive films; Conductivity measurement; Dielectric measurements; Dielectric substrates; Dielectric thin films; Frequency measurement; Gold; Microwave frequencies; Microwave measurements; Resonance; Thin metal films; conductivity; resonant techniques;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2006. APMC 2006. Asia-Pacific
Conference_Location :
Yokohama
Print_ISBN :
978-4-902339-08-6
Electronic_ISBN :
978-4-902339-11-6
Type :
conf
DOI :
10.1109/APMC.2006.4429490
Filename :
4429490
Link To Document :
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