• DocumentCode
    2759675
  • Title

    Thermal modeling of three-dimensional integrated circuits considering the thermal removal capability of different TSVs

  • Author

    Ding, Hua ; Wang, Wei ; Qian, Zhiliang ; Tsui, Chi-ying ; Lai, Liangzhen

  • Author_Institution
    Dept. of Electron. & Comput. Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
  • fYear
    2011
  • fDate
    19-20 July 2011
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    In this paper, a thorough comparison of the heat removal capability of different types of through silicon vias (TSVs) for three-dimensional ICs is presented. It is shown that power TSVs with the associated power delivery network (PDN) has significantly better heat removal capability than the other types of TSVs. An accurate and efficient thermal simulation methodology is then proposed by incorporating an accurate heat removal model of the PTSVs and PDN. Experimental results show that the accuracy of the proposed methodology is close to that of detailed 3-D finite volume based heat solver, while the computational effort is much lower.
  • Keywords
    finite volume methods; integrated circuit modelling; thermal analysis; three-dimensional integrated circuits; 3D finite volume method; heat removal model; heat solver; power TSV; power delivery network; thermal modeling; thermal removal capability; thermal simulation methodology; three-dimensional IC; three-dimensional integrated circuits; through silicon vias; Computational fluid dynamics; Equations; Heating; Metals; 3D-IC; TSV; Thermal model; nodal analysis method; power delivery network;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ASQED), 2011 3rd Asia Symposium on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4577-0145-0
  • Type

    conf

  • DOI
    10.1109/ASQED.2011.6111693
  • Filename
    6111693