DocumentCode :
2759732
Title :
New technique for analysing coplanar lines on ceramic up to 110GHz
Author :
Min, Chunwei ; Free, Charles E.
Author_Institution :
Univ. of Surrey, Guildford
fYear :
2006
fDate :
12-15 Dec. 2006
Firstpage :
591
Lastpage :
594
Abstract :
A novel four-line, two-geometry (FLTG) measurement technique using coplanar waveguide structures is proposed for investigations on material characteristics from 1 GHz to 110 GHz. This measurement-based technique is simple and efficient when compared with other methods, and provides less uncertainty in the analysis, especially at mm-wave frequencies. The technique has been applied to the characterisation of coplanar lines on ceramic that were fabricated using photoimage able thick-film technology. The key outcome of the work is that it provides means of establishing surface loss at mm-wave frequencies.
Keywords :
ceramics; coplanar waveguides; microwave measurement; strip lines; ceramic; coplanar lines; coplanar waveguide structures; four-line two-geometry measurement technique; photoim thick-film technology; surface loss; Ceramics; Circuits; Conducting materials; Coplanar waveguides; Dielectric loss measurement; Dielectric losses; Frequency; Rough surfaces; Surface resistance; Surface roughness; LTCC; Microwave measurement; coplanar waveguide lines; multi-chip module; photoimageable thick-film;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2006. APMC 2006. Asia-Pacific
Conference_Location :
Yokohama
Print_ISBN :
978-4-902339-08-6
Electronic_ISBN :
978-4-902339-11-6
Type :
conf
DOI :
10.1109/APMC.2006.4429495
Filename :
4429495
Link To Document :
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