DocumentCode :
2760092
Title :
Statistical leakage analysis by parallel Monte-Carlo programming on a CUDA platform
Author :
Ahn, Jungil ; Kim, Jinwook ; Kim, Young Hwan
Author_Institution :
Div. of Electr. Eng., Pohang Univ. of Sci. & Technol., Pohang, South Korea
fYear :
2011
fDate :
19-20 July 2011
Firstpage :
146
Lastpage :
150
Abstract :
The Monte-Carlo simulation based leakage current analysis provides very accurate results, but it has high computational complexity. In this paper, we present the Monte-Carlo based leakage estimation method, which is implemented on a GPU and a CUDA platform. Thereby using the Monte-Carlo method on a GPU, we can expect not only high simulation accuracy but also high estimation efficiency. Because a GPU contains hundreds of computational cores, it can perform the Monte-Carlo simulation for leakage estimation efficiently if we parallelize the algorithm. When the GPU executes the program in parallel, a large number of threads are generated. Each sample of the Monte-Carlo simulation is assigned to each thread and then all threads are executed at the same time. Because the proposed method is based on the Monte-Carlo simulation, any leakage model and any distribution of process parameter variation can be used. In the experiment, for the simplicity of simulation, the 1st order polynomial model is used. The simulation results imply that our approach is faster than the conventional Monte-Carlo simulation by about 130 times.
Keywords :
Monte Carlo methods; computational complexity; parallel architectures; parallel programming; polynomials; statistical analysis; CUDA platform; Monte-Carlo simulation; computational complexity; computational cores; leakage current analysis; parallel Monte-Carlo programming; polynomial model; statistical leakage analysis; Estimation; Graphics processing unit; Instruction sets; Integrated circuit modeling; Leakage current; Logic gates; Monte Carlo methods; CUDA; GPU; Leakage analysis; Monte-Carlo simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ASQED), 2011 3rd Asia Symposium on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4577-0145-0
Type :
conf
DOI :
10.1109/ASQED.2011.6111717
Filename :
6111717
Link To Document :
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