DocumentCode
2760103
Title
Assisting in fault localization using visual programming constructs
Author
Karam, Marcel R. ; Abdallah, Ayman Abi
Author_Institution
American Univ. of Beirut
fYear
2005
fDate
1-4 May 2005
Firstpage
856
Lastpage
860
Abstract
Locating variable definition use interactions (du-chains) that are associated with program faults is one of the most difficult and time-consuming task of the intraprocedural testing/debugging process. This task is further complicated by the presence of loops and aliases. To locate faults associated with untraversed du-chains, developers must identify suspicious variables, statements, controls and loop paths involved in failures. This paper presents a new technique that uses visualization to assist with these tasks. The technique employs a mapping scheme that uses visual artifacts and colors to visually map the participation of each statement, control, and variable du-chains, in the outcome of the execution of a procedure. Using our visual mapping technique, a user can inspect the colored artifacts, and identify, in addition to predicate and non-predicate statements, du-chains involved in failures, and potentially locate program faults. The paper also describes a prototype tool that implements our visual testing technique, along with a set of an empirical study that we have used to evaluate the error detection capability of our technique. The results of the subject we studied show that the technique can be effective in helping a user locate faults that are associated with untraversed statements, controls, and above all du-chains, in a procedure under test
Keywords
error detection; fault location; program debugging; program testing; visual programming; debugging process; error detection capability; fault localization; intraprocedural testing; mapping scheme; nonpredicate statements; program faults; prototype tool; visual artifacts; visual mapping technique; visual programming; visual testing technique; Automatic control; Color; Data visualization; Debugging; Fault detection; Fault diagnosis; Feedback; Lighting; Prototypes; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Computer Engineering, 2005. Canadian Conference on
Conference_Location
Saskatoon, Sask.
ISSN
0840-7789
Print_ISBN
0-7803-8885-2
Type
conf
DOI
10.1109/CCECE.2005.1557114
Filename
1557114
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