DocumentCode :
2760169
Title :
Test and design considerations for a 4 GHz gated ring oscillator in 65 nm CMOS technology for biomedical UWB applications
Author :
Novak, Ondrej ; Young, Darrin J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Utah, Salt Lake City, UT, USA
Volume :
1
fYear :
2010
fDate :
20-23 Sept. 2010
Firstpage :
1
Lastpage :
4
Abstract :
This paper describes the practical issues associated with the test and design of an impulse-based ultra wideband (I-UWB) transmitter for biomedical applications. A 4 GHz gated ring oscillator is designed and fabricated in a 65 nm CMOS process as a pulse generator for a pulse-position-modulated I-UWB transmitter. The parasitic effects on-chip and off-chip associated with the test setup are investigated, simulated, and experimentally verified. Modeling of the parasitic effects is developed for an improved accuracy in simulation as well as measurement. Further guidelines for design and packaging are introduced.
Keywords :
CMOS integrated circuits; biomedical electronics; oscillators; pulse generators; pulse position modulation; radio transmitters; ultra wideband technology; CMOS process; CMOS technology; biomedical UWB applications; frequency 4 GHz; gated ring oscillator; impulse-based ultra wideband transmitter; parasitic effects off-chip; parasitic effects on-chip; pulse generator; pulse-position-modulated I-UWB transmitter; size 65 nm;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultra-Wideband (ICUWB), 2010 IEEE International Conference on
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-5305-4
Electronic_ISBN :
978-1-4244-5306-1
Type :
conf
DOI :
10.1109/ICUWB.2010.5615750
Filename :
5615750
Link To Document :
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