Title :
Low power self-checking two-rail code checker design
Author_Institution :
Dept. of Electron. Eng., Nat. Chin-Yi Univ. of Technol., Taichung, Taiwan
Abstract :
Totally self-checking (TSC) system can execute on-line testing in normal operation mode and immediately detect the fault existing in a system to enhance reliability. In this paper, a novel non-tree structure two-rail code self-checking checker (denoted by TCC-P) is proposed. Based on TSMC 0.18um process technology, the real chip is designed and verified. The experiment results show that the proposed checker has reduced 39.30% power dissipation with the penalty of little area overhead as compared with the best one previous work. The feature of both lower power and the capability to work in both clock phases confirm our design is valid and efficient.
Keywords :
CMOS integrated circuits; integrated circuit reliability; integrated circuit testing; TCC-P; TSMC; low power self-checking system; online testing; reliability; two-rail code checker design; Circuit faults; Totally self-checking; checker; on-line test; two-rail code;
Conference_Titel :
Quality Electronic Design (ASQED), 2011 3rd Asia Symposium on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4577-0145-0
DOI :
10.1109/ASQED.2011.6111743