• DocumentCode
    2760462
  • Title

    A novel solenoidal basis for the MoM analysis of closed surfaces

  • Author

    Vipiana, F. ; Vecchi, G.

  • Author_Institution
    Antennas & EMC Lab., Politec. di Torino, Turin
  • fYear
    2008
  • fDate
    5-11 July 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In the electric field integral equation (EFIE) solved by the method of moments (MoM), it is well known that to avoid the ldquolow frequency breakdownrdquo the unknown current must be separated into a solenoidal part and a non-solenoidal remainder. In our previous works, we have posed more attention in generating an efficient Multi-Resolution (MR) basis for the non-solenoidal part of the current, keeping as solenoidal basis the standard loop basis. Instead here we propose a novel basis for the solenoidal part of the current, applying the MR concept also to this part. The developed basis is generated by a low complexity automatic algorithm, starting from a generic triangular mesh, without any constraints on mesh properties or topology. We have verified that in the case of closed structures, the conditioning of the solenoidal MoM sub-matrix (and consequently of the entire MoM matrix) is much lower than using the standard loop basis, where an arbitrary elementary (point) loop must be deleted.
  • Keywords
    electric field integral equations; electromagnetic wave scattering; method of moments; solenoids; MoM analysis; closed surfaces; electric field integral equation; generic triangular mesh; low complexity automatic algorithm; mesh properties; mesh topology; method of moments; multiresolution basis; nonsolenoidal remainder; solenoidal MoM sub-matrix; solenoidal basis; solenoidal part; Electric breakdown; Electromagnetic compatibility; Frequency; Integral equations; Matrix decomposition; Mesh generation; Moment methods; Singular value decomposition; Topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2008. AP-S 2008. IEEE
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    978-1-4244-2041-4
  • Electronic_ISBN
    978-1-4244-2042-1
  • Type

    conf

  • DOI
    10.1109/APS.2008.4618945
  • Filename
    4618945