DocumentCode :
2760564
Title :
0.18um low voltage 12-bit successive-approximation-register analog-to-digital converter (SAR ADC)
Author :
Ng, Mei Yee
Author_Institution :
MIMOS Berhad, Kuala Lumpur, Malaysia
fYear :
2011
fDate :
19-20 July 2011
Firstpage :
277
Lastpage :
281
Abstract :
This paper presents a 0.18um process Successive-Approximation Register Analog-to-Digital Converter (SAR ADC) design that can operate at a low voltage of minimum 1.4V across process corners and temperature with the power consumption of less than 100uW. The design comprises three main blocks namely a fully differential latched comparator, binary-weighted capacitors Digital-to-Analog Converter (DAC) and a SAR digital control logic module. The SAR ADC was designed to work at a minimum of 1.4V to cater to the 1.5V AA-battery +/-10% and accepts a maximum clock frequency of 500 kHz. In order to reduce the current consumption, this design uses the capacitors in the DAC as the sample-and-hold (S/H) component, together with a hybrid DAC architecture. The pre-amp used before the comparator has folded-cascode configuration to enable it to work at a low voltage level and differential outputs to account for noise cancellation. This circuit was designed using Silterra C18G 0.18um process.
Keywords :
analogue-digital conversion; comparators (circuits); digital-analogue conversion; network synthesis; preamplifiers; sample and hold circuits; AA-battery; S-H component; SAR digital control logic module; Silterra C18G process; binary-weighted capacitor DAC; digital-to-analog converter; frequency 500 kHz; fully-differential latched comparator; hybrid DAC architecture; low-voltage SAR ADC design; noise cancellation; preamplifier; sample-and-hold component; size 0.18 mum; successive-approximation-register analog-to-digital converter; voltage 1.4 V; voltage 1.5 V; Analog-digital conversion; Approximation methods; Capacitors; Latches; Low voltage; Power demand; Simulation; Low voltage ADC; SAR ADC; Successive Approximation Register Analog-to-Digital Converter;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ASQED), 2011 3rd Asia Symposium on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4577-0145-0
Type :
conf
DOI :
10.1109/ASQED.2011.6111760
Filename :
6111760
Link To Document :
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