Title : 
A study of the optical properties of the yellow-green AlGaInP and the blue-UV InGaN semiconductor materials
         
        
            Author : 
Kuo, Yen-Kuang ; Huang, Hsu-Ching ; Chang, Jih-Yuan ; Chang, Yuni ; Horng, Kuo-Kai ; Huang, Ya-Lien ; Lin, Wen-Wei ; Huang, Man-Fan
         
        
            Author_Institution : 
Dept. of Phys., Nat. Changhua Univ. of Educ., Taiwan
         
        
        
        
        
        
            Abstract : 
In this work, we study the optical properties of the 570-nm, yellow-green, AlGaInP semiconductor materials experimentally with a photoluminescence (PL) measurement system and numerically with a commercial Lastip simulation program. Specifically, the effects of the aluminum composition in wells of the AlGaInP MQW structures, the barrier height in quantum wells, the tensile strain barrier cladding (TSBC) next to the MQW region, the compensated strain in MQW, and the distributed Bragg reflector (DBR) on the optical properties of the AlGaInP devices are investigated. The optical properties of the blue and ultraviolet InGaN quantum well devices have also been investigated. The effects of the indium composition in quantum well, the well width, and the bowing parameter on the optical properties of the InGaN quantum well structures are studied numerically with the Lastip simulation program
         
        
            Keywords : 
III-V semiconductors; aluminium compounds; gallium compounds; indium compounds; photoluminescence; semiconductor quantum wells; 570 nm; AlGaInP; InGaN; Lastip program; barrier height; blue-ultraviolet emission; bowing parameter; distributed Bragg reflector; numerical simulation; optical properties; photoluminescence; quantum well structure; semiconductor material; strain compensation; tensile strain barrier cladding; yellow-green emission; Distributed Bragg reflectors; Gallium nitride; Indium; Large Hadron Collider; Optical arrays; Optical interconnections; Reflectivity; Silicon compounds; Vertical cavity surface emitting lasers; Wavelength measurement;
         
        
        
        
            Conference_Titel : 
Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE
         
        
            Conference_Location : 
Rio Grande
         
        
        
            Print_ISBN : 
0-7803-5947-X
         
        
        
            DOI : 
10.1109/LEOS.2000.894091