DocumentCode :
2760864
Title :
High-power single mode operation of hybrid ion-implanted/selectively-oxidized VCSELs
Author :
Hadley, G. Ronald ; Choquette, Kent D. ; Fischer, A.J. ; Geib, K.M. ; Allerman, A.A. ; Hindi, J.
Author_Institution :
Center for Compound Semicond. Sci. & Technol., Sandia Nat. Labs., Albuquerque, NM, USA
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
804
Abstract :
We first present numerical simulations that quantify this approach by predicting lateral mode discrimination for different sized gain apertures. These calculations are experimentally confirmed by the fabrication and testing of 850 nm VCSELs employing hybrid ion implantation/selective oxidation that produce a single-mode output of more than 5 mW. We performed VCSEL simulations using a 2D axisymmetric finite-difference code that solves for cavity eigenmodes including both mode shape and energy loss rate for a realistic VCSEL structure that includes gain and loss in the quantum well(s). We chose a VCSEL comprised of a 1-Λ cavity containing a single 100 A quantum well with 34 DBR pairs
Keywords :
distributed Bragg reflector lasers; eigenvalues and eigenfunctions; ion implantation; laser cavity resonators; laser modes; laser theory; optical fabrication; oxidation; quantum well lasers; semiconductor device models; surface emitting lasers; 1-Λ cavity; 2D axisymmetric finite-difference code; 5 mW; 850 nm; 850 nm VCSELs; DBR lasers; VCSEL simulations; VCSEL structure; cavity eigenmodes; energy loss rate; gain apertures; high-power single mode operation; hybrid ion implantation/selective oxidation; hybrid ion-implanted; lateral mode discrimination; mode shape; numerical simulations; quantum well lasers; selectively-oxidized VCSELs; single-mode output; Apertures; Energy loss; Fabrication; Finite difference methods; Ion implantation; Numerical simulation; Oxidation; Shape; Testing; Vertical cavity surface emitting lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE
Conference_Location :
Rio Grande
ISSN :
1092-8081
Print_ISBN :
0-7803-5947-X
Type :
conf
DOI :
10.1109/LEOS.2000.894098
Filename :
894098
Link To Document :
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