Title : 
Investigation of a tessellated meta-material planar circuit
         
        
            Author : 
Eccleston, Kimberley W.
         
        
            Author_Institution : 
Univ. of Canterbury, Christchurch
         
        
        
        
        
        
            Abstract : 
In this paper we investigate the propagation behavior of a square shaped planar meta-material guiding structure comprised of left-handed and right handed square unit cells each of the same size and arranged in a checker-board tessellation. The size of the planar structure is 19 cells by 19 cells and each cell is 8 mm by 8 mm. At 1 GHz, the left-handed unit cells have an insertion phase of 11deg and the right-handed unit cells have an insertion phase of -11deg. Both types of cells have the same Bloch impedance. The structure was fed at the centre unit cell, and there are a total of 76 peripheral ports each terminated in matched loads. At 1 GHz the power to each peripheral is equal and the phases at each port alternate between two values that differ by 11deg. Moreover, the planar structure exhibits the so-called infinite wavelength phenomenon in two dimensions and could be used in place of a circular radial power divider.
         
        
            Keywords : 
metamaterials; power dividers; radiowave propagation; Bloch impedance; checker-board tessellation; circular radial power divider; frequency 1 GHz; infinite wavelength phenomenon; left-handed square unit cells; propagation behavior; right handed square unit cells; square shaped planar meta-material guiding structure; tessellated meta-material planar circuit; Coupling circuits; Impedance; Microwave circuits; Microwave devices; Planar transmission lines; Power dividers; Power transmission lines; Refractive index; Topology; Transmission line theory; Meta-materials; left-handed materials; negative refractive index; planar circuits; power divider;
         
        
        
        
            Conference_Titel : 
Microwave Conference, 2006. APMC 2006. Asia-Pacific
         
        
            Conference_Location : 
Yokohama
         
        
            Print_ISBN : 
978-4-902339-08-6
         
        
            Electronic_ISBN : 
978-4-902339-11-6
         
        
        
            DOI : 
10.1109/APMC.2006.4429564