Title :
1997 21st International Conference on Microelectronics. Proceedings
Abstract :
The following topics were covered: technology CAD; microsystem technologies; semiconductor physics and characterisation; device physics and modeling; power technologies and devices; hybrid technologies and devices; process and device simulation; device reliability and characterisation; circuit design and application; system design and testing
Keywords :
integrated circuit design; integrated circuit modelling; integrated circuit reliability; integrated circuit testing; integrated circuits; micromechanical devices; network synthesis; semiconductor device models; semiconductor device reliability; semiconductor devices; semiconductor process modelling; MEMS; circuit design; device characterisation; device modeling; device physics; device reliability; device simulation; hybrid devices; hybrid technologies; microelectronics; microsystem technologies; power devices; power technologies; process simulation; semiconductor physics; system design; technology CAD; testing;
Conference_Titel :
Microelectronics, 1997. Proceedings., 1997 21st International Conference on
Conference_Location :
Nis, Yugoslavia
Print_ISBN :
0-7803-3664-X
DOI :
10.1109/ICMEL.1997.625163
