DocumentCode :
2761088
Title :
Titanium nitride-molybdenum metallizing method for aluminium nitride
Author :
Asai, Hironori ; Ueno, Fumio ; Iwase, Nobuo ; Sato, Hideki ; Mizunoya, Nobuyuki ; Kimura, Takashi ; Endo, Kazuo ; Takahashi, Takashi ; Sugiura, Yasuyuki
Author_Institution :
Toshiba Corp., Yokohama, Japan
fYear :
1989
fDate :
26-28 Apr 1989
Firstpage :
217
Lastpage :
220
Abstract :
A paste containing molybdenum (Mo) and titanium nitride (TiN) powders was printed on aluminium nitride (AlN) substrates and fired. The adhesive strength of substrates metallized with Ni/Au plate was about 25 kg/2.5 mm2 and was unchanged after a thermal cycle test. TiN-Mo does not adhere to the grain boundary phase of the AlN substrate nor to the surface oxide layer but to the AlN grain itself. This method, therefore, seems to be applicable to any kind of AlN substrate, which can have different grain boundary oxide phases and thermal conductivities. This TiN-Mo metallized AlN substrate replaced a beryllium oxide (BeO) heat sink, which has been used for RF power transistors. There was no trouble in assembling the AlN heat sinks into transistors. Thermal resistance and electrical properties of transistors with AlN heat sinks were almost equal to those of transistors with BeO heat sinks
Keywords :
aluminium compounds; grain boundaries; metallisation; molybdenum; power transistors; titanium compounds; AlN; RF power transistors; TiN-Mo-AlN; electrical properties; grain boundary phase; oxide phases; surface oxide layer; thermal conductivities; thermal cycle test; thermal resistance; Aluminum; Grain boundaries; Heat sinks; Metallization; Powders; Resistance heating; Thermal conductivity; Thermal resistance; Tin; Titanium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium, 1989, Proceedings. Japan IEMT Symposium, Sixth IEEE/CHMT International
Conference_Location :
Nara
Type :
conf
DOI :
10.1109/IEMTS.1989.76142
Filename :
76142
Link To Document :
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