Title :
On the Influence of Coding on the Mean Time to Failure for Degrading Memories with Defects
Author :
Vinck, Han ; Post, Karel
Author_Institution :
Eindhoven University of Technology, The Netherlands
Keywords :
Degradation; System testing;
Conference_Titel :
Information Theory Workshop at Cornell, The 1989 IEEE/CAM
DOI :
10.1109/ITW.1989.761430
