Title :
Low temperature acoustic microscopy for material characterization
Author :
Yamanaka, Kazushi ; Nagata, Yoshihiko ; Koda, Toshio ; Karaki, Koichi
Author_Institution :
Mech. Eng. Lab., Ibaraki, Japan
Abstract :
To characterize the mechanical properties of materials at low temperatures, a novel variable low-temperature scanning acoustic microscopy (VLTSAM) has been developed. The temperature of the sample can be continuously varied between 30°C and -94°C in a methanol coupler. As a demonstration of the VLTSAM, frozen onion cells were imaged at quenched and slowly cooled states. Defects in a 0.6-mm-thick epoxy layer were also observed at -30°C with much more sensitivity than at ambient temperatures. As a tool to analyze subsurface images in VLTSAM, the V(z) curve theory for SAM was extended to describe time-resolved subsurface echoes
Keywords :
acoustic microscopy; biological techniques and instruments; cellular biophysics; flaw detection; polymers; 30 to -94 degC; curve theory; defects; epoxy layer; frozen onion cells; material characterization; mechanical properties; methanol coupler; slowly cooled states; subsurface images; time-resolved subsurface echoes; variable low-temperature scanning acoustic microscopy; Acoustic materials; Acoustic transducers; Frequency; Methanol; Microscopy; Optical materials; Temperature control; Temperature distribution; Temperature sensors; Ultrasonic transducers;
Conference_Titel :
Ultrasonics Symposium, 1990. Proceedings., IEEE 1990
Conference_Location :
Honolulu, HI
DOI :
10.1109/ULTSYM.1990.171496
