Title :
On-Chip ECC for Multi-Level Random Access Memories
Author :
Goodman, Rodney M. ; Sayano, Masahiro
Author_Institution :
California Institute of Technology
Keywords :
Alpha particles; Decoding; Encoding; Error correction; Error correction codes; Product codes; Protection; Random access memory; Read-write memory; Reed-Solomon codes;
Conference_Titel :
Information Theory Workshop at Cornell, The 1989 IEEE/CAM
DOI :
10.1109/ITW.1989.761433
