DocumentCode :
2761471
Title :
Effect of heterobarrier leakage on the performance of high power 1.5-μm InGaAsP multiple quantum well lasers
Author :
Belenky, C. ; Shterengas, L. ; Trussel, W. ; Menna, R. ; Donetsky, D. ; Connolly, J. ; Garbuzov, D.
Author_Institution :
State Univ. of New York, Stony Brook, NY, USA
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
872
Abstract :
Eye-safe semiconductor lasers are in demand for development of laser range finder and countermeasure systems. These applications require high level of pulsed optical power. We carried out a comprehensive study of the nature of power saturation in 1.5-μm high power InGaAsP/InP multiple quantum well two step graded SCH lasers. We calculated the internal efficiency normalized to its threshold value for narrow waveguide devices from both the experimental L-I curves and the simulation results. The modeling explains qualitatively all experimental observations. The quantitative discrepancy can be understood taking into account two factors: device overheating even for short pulse operation at high current densities and the increase of the internal loss with current above threshold
Keywords :
III-V semiconductors; gallium arsenide; gradient index optics; indium compounds; laser modes; leakage currents; optical losses; quantum well lasers; waveguide lasers; 1.5 micron; InGaAsP-InP; device overheating; eyesafe semiconductor lasers; heterobarrier leakage effect; high current densities; high power MQW lasers; internal efficiency; internal loss increase; laser performance; narrow waveguide devices; power saturation; short pulse operation; spontaneous emission; threshold value; two step graded SCH lasers; Current density; Indium phosphide; Laser modes; Optical pulses; Optical saturation; Optical waveguides; Power lasers; Quantum well lasers; Semiconductor lasers; Waveguide lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE
Conference_Location :
Rio Grande
ISSN :
1092-8081
Print_ISBN :
0-7803-5947-X
Type :
conf
DOI :
10.1109/LEOS.2000.894132
Filename :
894132
Link To Document :
بازگشت