مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2761517

Title :

Optical Delay Tester

Author :

Ozaki, Kazuyuki ; Nagai, Toshiaki ; Wakana, Shin-ichi ; Sato, Yoko ; Goto, Yoshiro

fYear :

1993

fDate :

9-11 Jun 1993

Firstpage :

267

Lastpage :

270

Keywords :

Delay effects; High speed optical techniques; Integrated circuit testing; Lasers and electrooptics; Optical films; Optical pulses; Optical sensors; Photonic integrated circuits; Sampling methods; Voltage;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Electronic Manufacturing Technology Symposium, 1993., Proceedings of 1993 Japan International

Print_ISBN :

0-7803-1432-8

Type :

conf

DOI :

10.1109/IEMT.1993.639767

Filename :

639767

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2761517