DocumentCode :
2761573
Title :
Supporting Concern-Based Regression Testing and Prioritization in a Model-Driven Environment
Author :
Filho, Roberto S Silva ; Budnik, Christof J. ; Hasling, William M. ; McKenna, Monica ; Subramanyan, Rajesh
Author_Institution :
Software Eng. Dept., Siemens Corp. Res., Princeton, NJ, USA
fYear :
2010
fDate :
19-23 July 2010
Firstpage :
323
Lastpage :
328
Abstract :
Traditional regression testing and prioritization approaches are bottom-up (or white-box). They rely on the analysis of the impact of changes in source code artifacts, identifying corresponding parts of software to retest. While effective in minimizing the amount of testing required to validate code changes, they do not leverage on specification-level design and requirements concerns that motivated these changes. Model-based testing approaches support a top-down (or black box) testing approach, where design and requirements models are used in support of test generation. They augment code-based approaches with the ability to test from a higher-level design and requirements perspective. In this paper, we present a model-based regression testing and prioritization approach that efficiently selects test cases for regression testing based on different concerns. It relies on traceability links between models, test cases and code artifacts, together with user-defined properties associated to model elements. In particular we describe how to support concern-based regression testing and prioritization using TDE/UML, an extensible model-based testing environment.
Keywords :
program testing; regression analysis; UML; code based approaches; model based testing approaches; model driven environment; source code artifacts; specification level design; supporting concern based regression testing; user defined properties; Model-driven testing; regression testing; test development; test prioritization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Software and Applications Conference Workshops (COMPSACW), 2010 IEEE 34th Annual
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-8089-0
Electronic_ISBN :
978-0-7695-4105-1
Type :
conf
DOI :
10.1109/COMPSACW.2010.63
Filename :
5615818
Link To Document :
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