• DocumentCode
    2761676
  • Title

    Grain and stress characterization with thermoelastic microscopy

  • Author

    Cretin, B. ; Mahmoud, A. ; Hauden, D. ; Takadoum, J.

  • Author_Institution
    Lab. de Phys. et Metrologie des Oscillateurs du CNRS, Univ. de Franche-Comte-Besancon, France
  • fYear
    1990
  • fDate
    4-7 Dec 1990
  • Firstpage
    1003
  • Abstract
    The thermoelastic microscope principle is described, and some applications of this technique to grain and stress characterization in metals are presented. The results demonstrate that the thermoelastic microscope allows anisotropy imaging and stress measurement. With the setup described, both qualitative information (imaging, defect visualization and geometrical characterization) and quantitative information (material or phase analysis using the transfer function, and thermal or elastic constant indirect measurement) can be obtained
  • Keywords
    flaw detection; metals; stress measurement; thermoelasticity; anisotropy imaging; defect visualization; elastic constant indirect measurement; geometrical characterization; grain characterization; metals; phase analysis; stress characterization; stress measurement; thermoelastic microscopy; transfer function; Anisotropic magnetoresistance; Image analysis; Information analysis; Microscopy; Phase measurement; Stress measurement; Thermal stresses; Thermoelasticity; Transfer functions; Visualization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1990. Proceedings., IEEE 1990
  • Conference_Location
    Honolulu, HI
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1990.171513
  • Filename
    171513