DocumentCode :
2761676
Title :
Grain and stress characterization with thermoelastic microscopy
Author :
Cretin, B. ; Mahmoud, A. ; Hauden, D. ; Takadoum, J.
Author_Institution :
Lab. de Phys. et Metrologie des Oscillateurs du CNRS, Univ. de Franche-Comte-Besancon, France
fYear :
1990
fDate :
4-7 Dec 1990
Firstpage :
1003
Abstract :
The thermoelastic microscope principle is described, and some applications of this technique to grain and stress characterization in metals are presented. The results demonstrate that the thermoelastic microscope allows anisotropy imaging and stress measurement. With the setup described, both qualitative information (imaging, defect visualization and geometrical characterization) and quantitative information (material or phase analysis using the transfer function, and thermal or elastic constant indirect measurement) can be obtained
Keywords :
flaw detection; metals; stress measurement; thermoelasticity; anisotropy imaging; defect visualization; elastic constant indirect measurement; geometrical characterization; grain characterization; metals; phase analysis; stress characterization; stress measurement; thermoelastic microscopy; transfer function; Anisotropic magnetoresistance; Image analysis; Information analysis; Microscopy; Phase measurement; Stress measurement; Thermal stresses; Thermoelasticity; Transfer functions; Visualization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1990. Proceedings., IEEE 1990
Conference_Location :
Honolulu, HI
Type :
conf
DOI :
10.1109/ULTSYM.1990.171513
Filename :
171513
Link To Document :
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