Title :
Near-field characterization of micro-aperture surface emitting laser for near field data storage
Author :
Shinada, S. ; Koyama, F. ; Nishiyama, N. ; Arai, M. ; Iga, K.
Author_Institution :
P & I Microsyst. Res. Centre, Tokyo Inst. of Technol., Japan
Abstract :
Summary form only given. We have fabricated a 400 nm square micro-aperture VCSEL with single transverse mode operation. We carried out the near field characterization using a sharpened fiber probe. The FWHM of intensity below threshold was 250 nm, and our metal micro-aperture VCSEL may have a potential for a high resolution optical head
Keywords :
distributed Bragg reflector lasers; laser modes; laser transitions; optical microscopy; optical storage; optical testing; semiconductor device testing; semiconductor lasers; surface emitting lasers; 400 nm; high resolution optical head; metal micro-aperture VCSEL; micro-aperture VCSEL; micro-aperture surface emitting laser; near field data storage; near-field characterization; sharpened fiber probe; single transverse mode operation; Memory; Probes; Surface emitting lasers;
Conference_Titel :
Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE
Conference_Location :
Rio Grande
Print_ISBN :
0-7803-5947-X
DOI :
10.1109/LEOS.2000.894144
