Title :
Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159)
Abstract :
The following topics are dealt with: system test; ATE software generation; defect behaviour and analysis; BIST; fault diagnosis; design validation; ADC testing; delay fault testing; optimisation of test strategies; memory testing; bridging faults; crosstalk test; embedded memories; PC board testing; testing up to 1 GHz; SOC tests; low-power BIST; microprocessor tests; physical defects tests; using models; logic testing; FPGA testing; low-power optimisation; fault models; HF tests; error detection; delay testing; processor test cores; DFT; and embedded tests
Keywords :
automatic test equipment; automatic testing; built-in self test; electronic equipment testing; fault diagnosis; logic testing; 1 GHz; ADC testing; ATE software generation; BIST; DFT; FPGA; HF tests; PC board testing; SOC tests; bridging faults; crosstalk test; defect behaviour; delay fault testing; delay testing; design validation; embedded memories; embedded tests; error detection; fault diagnosis; fault models; logic testing; low-power BIST; low-power optimisation; memory testing; microprocessor tests; models; optimisation; physical defects test; processor test cores; system test;
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-7803-6546-1
DOI :
10.1109/TEST.2000.894146
