Title :
On-line and off-line test of airborne digital systems: a reliability study
Author_Institution :
Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
Abstract :
This paper deals with studying the effects of both on-line and off-line test during flight critical missions where safety is a major issue. The on-line test, in this context, is a test performed on a digital airborne system during some specified windows in time while it is still performing its intended task. An off-line test is a test that is performed on the digital system once it is taken, off-line because of a suspected failure. Both the on-line and the off-line tests are performed during flight. The difference between the two is that the off-line test can be made more effective than an on-line test due to the longer amount of time available for testing. Moreover, the off-line test may be designed to have diagnosis and repair capabilities built-in. Upon successful repair, the faulty processor may be reconfigured back into the system. This capability will undoubtedly increase the mission reliability
Keywords :
Markov processes; aircraft computers; avionics; boundary scan testing; built-in self test; design for testability; electromagnetic interference; fault tolerant computing; ASSIST code; BIST; DFT; EMI compliance; airborne digital systems; boundary scan; built-in diagnosis and repair; digital avionics; fault tolerance; flight critical missions; off-line test; on-line test; reliability study; semi-Markov chain; Aerospace control; Aerospace electronics; Aircraft manufacture; Circuit faults; Circuit testing; Design for testability; Digital systems; Electromagnetic devices; Electromagnetic interference; System testing;
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-6546-1
DOI :
10.1109/TEST.2000.894148