Title :
Bridging the gap between embedded test and ATE
Author :
Bell, Martin ; Danialy, Givargis ; Howells, Michael ; Pateras, Stephen
Author_Institution :
LogicVision Inc., San Jose, CA, USA
Abstract :
This paper presents a methodology and software system architecture that enable conventional test equipment to take full advantage of embedded test structures implemented within the device under test. The proposed methodology provides a seamless transfer of embedded test related information from the design engineering to the manufacturing test environment, allowing for automated control of the embedded test for production go/no-go testing as well as advanced failure diagnosis
Keywords :
application program interfaces; automatic test equipment; automatic test pattern generation; automatic test software; built-in self test; design for testability; embedded systems; production testing; software architecture; API; ATE; BIST; IP generator; advanced failure diagnosis; automated control; design engineering environment; embedded test access software; embedded test structures; manufacturing test environment; production go/no-go testing; seamless transfer; software integration; software system architecture; test methodology; Automatic control; Automatic testing; Computer architecture; Design engineering; Manufacturing automation; Production; Software systems; Software testing; System testing; Test equipment;
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-6546-1
DOI :
10.1109/TEST.2000.894191
