Title :
Doing it in STIL: intelligent conversion from STIL to an ATE format
Author :
Parnas, Bruce R.
Author_Institution :
Advantest America R&D Center, Santa Clara, CA, USA
Abstract :
The STIL test language has recently become a standard. Most test systems do not use STIL as a native language, however. There is a requirement for conversion from STIL to a tester´s native language. This paper presents a methodology for intelligent and efficient conversion from STIL to a cycle-based tester format
Keywords :
automatic test equipment; automatic test pattern generation; automatic test software; boundary scan testing; high level languages; ATE format; ATPG; STIL test language; cycle-based tester format; efficient conversion; event-based intermediate format; intelligent conversion; output signal conversion; scan test; table-based analysis; template matching; Automatic test pattern generation; Benchmark testing; Data analysis; Optical signal processing; Prototypes; Runtime; System testing; Timing;
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-6546-1
DOI :
10.1109/TEST.2000.894192
