DocumentCode
2761979
Title
DFT advances in Motorola´s Next-Generation 74xx PowerPCTM microprocessor
Author
Raina, Rajesh ; Bailey, Robert ; Belete, Dawit ; Khosa, Vikram ; Molyneaux, Robert ; Prado, Javier ; Rasdan, A.
Author_Institution
Somerset Design Center, Motorola Inc., Austin, TX, USA
fYear
2000
fDate
2000
Firstpage
131
Lastpage
140
Abstract
This paper shares techniques used to overcome DFT challenges on Motorola´s Next-Generation 74xx PowerPCTM microprocessor-a 700+ MHz microprocessor with an on-chip, 256 K byte second-level cache
Keywords
cache storage; design for testability; integrated circuit testing; microprocessor chips; 256 Kbit; 700 MHz; DFT; Motorola Next-Generation 74xx PowerPC microprocessor; on-chip second-level cache; Built-in self-test; CMOS process; Copper; Cost function; Design for testability; Frequency; Logic design; Logic testing; Microprocessors; Signal design;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2000. Proceedings. International
Conference_Location
Atlantic City, NJ
ISSN
1089-3539
Print_ISBN
0-7803-6546-1
Type
conf
DOI
10.1109/TEST.2000.894200
Filename
894200
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