• DocumentCode
    2761979
  • Title

    DFT advances in Motorola´s Next-Generation 74xx PowerPCTM microprocessor

  • Author

    Raina, Rajesh ; Bailey, Robert ; Belete, Dawit ; Khosa, Vikram ; Molyneaux, Robert ; Prado, Javier ; Rasdan, A.

  • Author_Institution
    Somerset Design Center, Motorola Inc., Austin, TX, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    131
  • Lastpage
    140
  • Abstract
    This paper shares techniques used to overcome DFT challenges on Motorola´s Next-Generation 74xx PowerPCTM microprocessor-a 700+ MHz microprocessor with an on-chip, 256 K byte second-level cache
  • Keywords
    cache storage; design for testability; integrated circuit testing; microprocessor chips; 256 Kbit; 700 MHz; DFT; Motorola Next-Generation 74xx PowerPC microprocessor; on-chip second-level cache; Built-in self-test; CMOS process; Copper; Cost function; Design for testability; Frequency; Logic design; Logic testing; Microprocessors; Signal design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2000. Proceedings. International
  • Conference_Location
    Atlantic City, NJ
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-6546-1
  • Type

    conf

  • DOI
    10.1109/TEST.2000.894200
  • Filename
    894200