• DocumentCode
    2761997
  • Title

    The testability features of the MCF5407 containing the 4th generation ColdFire(R) microprocessor core

  • Author

    McLaurin, Teresa L. ; Frederick, Frank

  • Author_Institution
    Motorola Inc., Austin, TX, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    151
  • Lastpage
    159
  • Abstract
    The DFT and Test challenges faced, and the solutions applied, to the newest member of the ColdFire(R) microprocessor family, the MCF5407, are described in this paper. The MCF5407 is the first member of the family to utilize a PLL-sourced clock to do at-speed launch-to-capture cycles. This PLL-sourced test clock can be “chopped” in any manner needed for core to asic ratios between 4:1 and 1:1. The internal microprocessor core of the MCF5407 was designed as a separate stand-alone core. The DFT challenges and solutions described in this paper involve the challenges that are above and beyond the challenges of the MCF5307; including the PLL clock chop and enhanced PLL scan testing
  • Keywords
    design for testability; digital phase locked loops; integrated circuit testing; microprocessor chips; ColdFire microprocessor; DFT; MCF5407; PLL clock chop; PLL scan testing; at-speed launch-to-capture cycle; fourth generation technology; testability; AC generators; Automatic test pattern generation; Automatic testing; Clocks; Cost function; Delay; Logic; Microprocessors; Phase locked loops; Signal generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2000. Proceedings. International
  • Conference_Location
    Atlantic City, NJ
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-6546-1
  • Type

    conf

  • DOI
    10.1109/TEST.2000.894202
  • Filename
    894202