Title :
Si-emulation: system verification using simulation and emulation
Author :
Yang, Zan ; Min, Byeong ; Choi, Gwan
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., USA
Abstract :
A system-level verification framework is presented that combines the speed of hard-wired (FPGA-based) emulation and the observability of gate-level simulation. A checkpoint approach is developed for (1) periodic capturing of the machine state from an emulation, (2) sampling of the emulation output for error detection, and (3) constructing a piece-wise simulation run, necessary to debug the design in an event of an error detection from the emulation. The checkpoint frequency is optimized to reduce the cost of downloading the state data during a hardware emulation. A sampling of the emulation output also minimizes the network-bandwidth and storage-space requirements associated with instrumenting for error detection
Keywords :
automatic testing; digital simulation; electronic equipment testing; error detection; fault diagnosis; formal verification; observability; checkpoint frequency; cost; emulation; error detection; gate-level simulation; hard-wired emulation; hardware emulation; network-bandwidth; observability; periodic capturing; piece-wise simulation; sampling; system verification; Application software; Circuit faults; Circuit simulation; Circuit testing; Clocks; Emulation; Event detection; Hardware; Sampling methods; Software testing;
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-6546-1
DOI :
10.1109/TEST.2000.894203
