DocumentCode :
2762153
Title :
Automation Of Memory Failure Analysis By Combining An Expert System With A Memory Tester/analyzer
Author :
Hamada, Hiroyuki ; Tsujide, Tohru ; Hisii, Tosiyasu
fYear :
1993
fDate :
9-11 Jun 1993
Firstpage :
283
Lastpage :
286
Keywords :
Automatic testing; Automation; Capacitors; Expert systems; Failure analysis; Manufacturing; Nonvolatile memory; Pattern analysis; Random access memory; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium, 1993., Proceedings of 1993 Japan International
Print_ISBN :
0-7803-1432-8
Type :
conf
DOI :
10.1109/IEMT.1993.639771
Filename :
639771
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2762153
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