DocumentCode
2762153
Title
Automation Of Memory Failure Analysis By Combining An Expert System With A Memory Tester/analyzer
Author
Hamada, Hiroyuki ; Tsujide, Tohru ; Hisii, Tosiyasu
fYear
1993
fDate
9-11 Jun 1993
Firstpage
283
Lastpage
286
Keywords
Automatic testing; Automation; Capacitors; Expert systems; Failure analysis; Manufacturing; Nonvolatile memory; Pattern analysis; Random access memory; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Manufacturing Technology Symposium, 1993., Proceedings of 1993 Japan International
Print_ISBN
0-7803-1432-8
Type
conf
DOI
10.1109/IEMT.1993.639771
Filename
639771
Link To Document