Title :
Nonparametric flaw detection in large grained materials
Author :
Bilgutay, N.M. ; Donohue, K.D. ; Li, X.
Author_Institution :
Dept. of Electr. & Comput. Eng., Drexel Univ., Philadelphia, PA, USA
Abstract :
The detection of targets embedded in dense microstructure scatterers using ultrasonic pulse-echo systems is examined. Split-spectrum processing (SSP) is presented as an efficient method for discriminating between target echoes and microstructure scattering based on differences between their RF phase patterns. The design of constant false-alarm thresholds is described for the F-test applied to RF SSP vectors. Experimental results are presented for A-scans from large-grain stainless-steel samples with flat-bottom holes
Keywords :
crystal microstructure; flaw detection; stainless steel; ultrasonic materials testing; A-scans; RF phase patterns; constant false-alarm thresholds; dense microstructure scatterers; design; detection; flat-bottom holes; large grained materials; large-grain stainless-steel samples; microstructure scattering; nonparametric flaw detection; split spectrum processing; target echoes; targets; ultrasonic pulse-echo systems; Band pass filters; Filtering; Frequency diversity; Microstructure; Narrowband; Radar detection; Radar scattering; Steel; Testing; Ultrasonic imaging;
Conference_Titel :
Ultrasonics Symposium, 1990. Proceedings., IEEE 1990
Conference_Location :
Honolulu, HI
DOI :
10.1109/ULTSYM.1990.171540
