Title :
Deterministic partitioning techniques for fault diagnosis in scan-based BIST
Author :
Bayraktaroglu, Ismet ; Orailo, Alex
Author_Institution :
Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
Abstract :
A deterministic partitioning technique for fault diagnosis in scan-based BIST is proposed. Properties of high quality partitions for improved fault diagnosis times are identified and low cost hardware implementations of high quality deterministic partitions are outlined. The superiority of the partitions generated by the proposed approach is confirmed through mathematical analysis. Theoretical analyses, worst case bounds, and experimental simulation data all confirm the superiority of the proposed deterministic approaches
Keywords :
built-in self test; design for testability; fault diagnosis; logic partitioning; logic testing; deterministic partitioning technique; diagnosis times; experimental simulation data; fault diagnosis; high quality deterministic partitions; low cost hardware implementations; scan-based BIST; worst case bounds; Analytical models; Automatic testing; Built-in self-test; Computer science; Costs; Data mining; Fault diagnosis; Hardware; Mathematical analysis; Polynomials;
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-6546-1
DOI :
10.1109/TEST.2000.894215
