DocumentCode :
2762241
Title :
Application of morphological filters in ultrasonic flaw detection
Author :
Mohamed, M.A. ; Saniie, J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
fYear :
1990
fDate :
4-7 Dec 1990
Firstpage :
1157
Abstract :
Morphological filters were used to detect flaws in ultrasonic signals contained by grain scattering noise (i.e., speckles). In particular, the deterministic and stochastic properties of morphological filters were studied in the context of utilizing different structuring elements. The structuring elements were characterized by their shape, width, and height. The information content of ultrasonic signals was used to design a suitable structuring element to enhance the flaw-to-clutter ratio. The processed experimental results show that morphological filters can detect flaw echoes while the suppressing microstructure noise
Keywords :
flaw detection; ultrasonic materials testing; flaw echoes; flaw-to-clutter ratio; grain scattering noise; height; information content; microstructure noise; morphological filters; shape; stochastic properties; structuring elements; ultrasonic flaw detection; ultrasonic signals; width; Application software; Filters; Microstructure; Morphological operations; Morphology; Noise shaping; Scattering; Shape; Signal design; Stochastic resonance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1990. Proceedings., IEEE 1990
Conference_Location :
Honolulu, HI
Type :
conf
DOI :
10.1109/ULTSYM.1990.171544
Filename :
171544
Link To Document :
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