Title :
The single event effects performance of low power embedded fixed point digital signal processors and microprocessor
Author :
Hiemstra, David M. ; Deschenes, David ; Hill, Darren
Author_Institution :
MDA, BC
Abstract :
In this paper, the approach followed to characterize the single event upset susceptibility of the analog devices Blackfin BF533 and Texas Instruments TMS320VC5510 embedded digital signal processors; and the Freescale Semiconductor Coldfire M5249C3 embedded microprocessor using high energy protons, is presented. Single event latchup and total dose effects are also discussed
Keywords :
digital signal processing chips; low-power electronics; Blackfin BF533; Freescale Semiconductor Coldfire; M5249C3; TMS320VC5510; Texas Instruments; analog devices; high energy protons; low power embedded fixed point digital signal processors; microprocessor; single event effects; single event upset susceptibility; Atmosphere; Digital signal processors; Instruments; Mars; Memory management; Microprocessors; Performance evaluation; Protons; Single event upset; Testing;
Conference_Titel :
Electrical and Computer Engineering, 2005. Canadian Conference on
Conference_Location :
Saskatoon, Sask.
Print_ISBN :
0-7803-8885-2
DOI :
10.1109/CCECE.2005.1557254
