Title :
Comparing functional and structural tests
Author :
Maxwell, Peter ; Hartanto, Ismed ; Bentz, Lee
Abstract :
This paper describes an experimental study to understand issues and requirements for structural-based testing using low cost testers, compared to functional-based testing using expensive testers. Several studies have been directed at the effectiveness of various test methods, but none explicitly addressed issues involved in attempting to replace functional vectors with scan vectors and none carried the experiment further by placing defective chips into systems and running system tests. This paper describes the results of such an experiment and offers insight into necessary requirements for reduction or elimination of functional tests
Keywords :
automatic testing; digital integrated circuits; integrated circuit testing; logic testing; expensive testers; functional tests; functional vectors; low cost testers; scan testing; scan vectors; structural tests; system tests; test methods comparison; Built-in self-test; Clocks; Cost function; Electronic equipment testing; Manufacturing; Pins; System testing; Test equipment; Time to market; Timing;
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-6546-1
DOI :
10.1109/TEST.2000.894231
