• DocumentCode
    2762492
  • Title

    Decreasing the time-to-market through virtual risk assessment and risk mitigation

  • Author

    Pecht, Michael G. ; McCluskey, Patrick F. ; West, Norman W. ; Azarm, Shapour ; Pecht, Judy

  • Author_Institution
    CALCE Center for Electron. Packaging, Maryland Univ., College Park, MD, USA
  • Volume
    1
  • fYear
    1997
  • fDate
    14-17 Sep 1997
  • Firstpage
    25
  • Abstract
    One of the most time consuming activities in new product development is reliability risk assessment, defined as an audit of the ability of the design, manufacture, and assembly processes to meet reliability goals; that is, whether the anticipated reliability is indeed achieved under actual life cycle loads for some specified length of time. In general, qualification methods have been borrowed from the military, without knowledge of the rationale or assessment of the true benefits. In fact, prediction of field reliability from these tests has generally been quite poor. Nevertheless, the amount and length of such qualification testing has increased over the years. This presentation provides a background to the reliability risk assessment problem that much of the electronics product and systems industry is faced with today. Then an approach to reliability risk assessment and risk mitigation is given, along with a virtual method, which requires very little time and money, because the process is simulated
  • Keywords
    conformance testing; electronics industry; failure analysis; product development; reliability theory; risk management; electronic systems industry; electronics product industry; field reliability; product development; qualification testing; reliability risk assessment; risk mitigation; virtual method; Application specific integrated circuits; Assembly; Costs; Life estimation; Life testing; Military standards; Product development; Qualifications; Risk management; Time to market;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 1997. Proceedings., 1997 21st International Conference on
  • Conference_Location
    Nis
  • Print_ISBN
    0-7803-3664-X
  • Type

    conf

  • DOI
    10.1109/ICMEL.1997.625171
  • Filename
    625171