DocumentCode
2762529
Title
Pattern generation tools for the development of memory core test patterns for Rambus devices
Author
Privitera, John ; Woo, Steven ; Soldat, Craig
Author_Institution
Rambus Inc., USA
fYear
2000
fDate
2000
Firstpage
444
Lastpage
453
Abstract
This paper presents tools that were used in the development of test patterns for Rambus memory devices, Three tools are presented in this paper, Radical, the RL pre-processor, and Rad2MTL. RL and Rad2MTL exploit the capabilities of an executable software model for Rambus DRAMs (Radical) to allow a user to create patterns in a language that supports packet-based protocols and translate the pattern to the Algorithmic Pattern Generator language (MTL) of a memory tester
Keywords
automatic test pattern generation; integrated circuit testing; integrated memory circuits; logic testing; memory protocols; software tools; ATPG; Algorithmic Pattern Generator language; DRAMs; RL pre-processor tool; Rad2MTL tool; Radical tool; Rambus devices; executable software model; memory core test patterns; packet-based protocols; pattern generation tools; Bandwidth; Circuit testing; Logic devices; Logic testing; Process design; Protocols; Random access memory; Software performance; System testing; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2000. Proceedings. International
Conference_Location
Atlantic City, NJ
ISSN
1089-3539
Print_ISBN
0-7803-6546-1
Type
conf
DOI
10.1109/TEST.2000.894236
Filename
894236
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