Title :
Test method evaluation experiments and data
Author :
Nigh, Phil ; Gattiker, Anne
Author_Institution :
Microelectron. Div., IBM Corp., Essex Junction, VT, USA
Abstract :
Understanding the effectiveness of their production tests is a critical task for IC suppliers. Numerous trends suggesting that conventionally applied test methods must change to meet future needs will make the task even more critical-and difficult-in the future. This paper presents characterization and diagnostic data and ideas aimed at helping IC suppliers understand test effectiveness
Keywords :
VLSI; failure analysis; integrated circuit testing; production testing; IC production tests; IC suppliers; IDDQ testing; characterization data; defect detection; diagnostic data; test effectiveness; test method evaluation data; test method evaluation experiments; Acceleration; Added delay; Bridge circuits; Circuit testing; Failure analysis; Integrated circuit testing; Leakage current; Logic testing; Time to market; Voltage;
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-6546-1
DOI :
10.1109/TEST.2000.894237
