Title :
A new paradigm in test for the next millennium
Author :
Katz, Jerry ; Rajsuman, Rochit
Author_Institution :
Advantest Test Eng. Corp., Advantest Inc., Santa Clara, CA, USA
Abstract :
In this paper we describe the architecture and implementation of a true simulation-direct-to-test event based tester. This tester uses event based design simulation data in the VCD form. This data is used as-is without requiring tester cyclization. It is a true per pin tester that can significantly shorten test complexity and time-to-market
Keywords :
automatic test equipment; discrete event simulation; integrated circuit testing; ATE; VCD; event-based design simulation; integrated circuit testing; simulation-direct-to-test event-based tester; Circuit testing; Computer architecture; Costs; Design engineering; Discrete event simulation; Integrated circuit testing; Logic devices; Logic testing; Timing; Vehicles;
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-6546-1
DOI :
10.1109/TEST.2000.894239
