DocumentCode :
2762740
Title :
Surface Deftct Inspection For Small Sizes Of Chip- Electronic-Parts Applying Color lmage Analysis Techniques
Author :
Tanigichi, Keiji ; Nagata, Satoshi ; Xiaolin, Xu ; Uno, Toshihiro ; Yamamoto, Hiroaki ; Seki, Tetuji ; Kawabata, Syouichi ; Yamana, Noriaki
fYear :
1993
fDate :
9-11 Jun 1993
Firstpage :
299
Lastpage :
302
Keywords :
Coordinate measuring machines; Dielectrics; Image analysis; Image color analysis; Information science; Inspection; Measurement standards; Space technology; System testing; Tellurium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium, 1993., Proceedings of 1993 Japan International
Print_ISBN :
0-7803-1432-8
Type :
conf
DOI :
10.1109/IEMT.1993.639775
Filename :
639775
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2762740
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