DocumentCode
2762740
Title
Surface Deftct Inspection For Small Sizes Of Chip- Electronic-Parts Applying Color lmage Analysis Techniques
Author
Tanigichi, Keiji ; Nagata, Satoshi ; Xiaolin, Xu ; Uno, Toshihiro ; Yamamoto, Hiroaki ; Seki, Tetuji ; Kawabata, Syouichi ; Yamana, Noriaki
fYear
1993
fDate
9-11 Jun 1993
Firstpage
299
Lastpage
302
Keywords
Coordinate measuring machines; Dielectrics; Image analysis; Image color analysis; Information science; Inspection; Measurement standards; Space technology; System testing; Tellurium;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Manufacturing Technology Symposium, 1993., Proceedings of 1993 Japan International
Print_ISBN
0-7803-1432-8
Type
conf
DOI
10.1109/IEMT.1993.639775
Filename
639775
Link To Document