Title :
Measurement of longitudinal wave properties of low velocity materials using the acoustic microscope
Author :
Chan, K.H. ; Bertoni, H.L.
Author_Institution :
Dept. of Electr. Eng., Polytech. Univ., New York, NY, USA
Abstract :
In order to measure lateral wave properties for materials having low acoustic velocities, such as polymers, a ray analysis of the excitation, propagation, and subsequent detection of the longitudinal lateral waves was performed. Measurements of the output voltage V with defocus distance z were made using a 50-MHz microscope for several polymeric materials. Ordinary processing of V (z) was used to extract the longitudinal wave velocity for these materials. A least-squares fit of the theoretical to the measured V(z), over the range of validity of the lateral wave expression, was used to find the longitudinal wave attenuation constant
Keywords :
acoustic microscopy; acoustic wave absorption; acoustic wave velocity; least squares approximations; polymers; 50 MHz; acoustic microscope; attenuation constant; black nylon 6/6 substrate; defocus distance; least-squares fit; longitudinal lateral waves; low acoustic velocities; polymers; polystyrene styron 615 substrate; ray analysis; Acoustic materials; Acoustic measurements; Acoustic propagation; Acoustic signal detection; Acoustic waves; Performance analysis; Performance evaluation; Polymers; Velocity measurement; Voltage;
Conference_Titel :
Ultrasonics Symposium, 1990. Proceedings., IEEE 1990
Conference_Location :
Honolulu, HI
DOI :
10.1109/ULTSYM.1990.171580