DocumentCode :
2762970
Title :
Non-intrusive BIST for systems-on-a-chip
Author :
Chiusano, Silvia ; Prijetto, P. ; Wunderlich, Hans-Joachim
Author_Institution :
Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
fYear :
2000
fDate :
2000
Firstpage :
644
Lastpage :
651
Abstract :
The term “functional BIST” describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within other parts of the system. It is a promising solution for self-testing complex digital systems at reduced costs in terms of area overhead and performance degradation. While previous work mainly investigated the use of functional modules for generating pseudo-random and pseudo-exhaustive test patterns, the present paper shows that a variety of modules can also be used as a deterministic test pattern generator via an appropriate reseeding strategy. This method enables a BIST technique that does not introduce additional hardware like test points and test registers into combinational and pipelined modules under test. The experimental results prove that the reseeding method works for accumulator based structures, multipliers, or encryption modules as efficiently as for the classic linear feedback shift registers, and some times even better
Keywords :
VLSI; application specific integrated circuits; automatic test pattern generation; built-in self test; digital signal processing chips; integrated circuit testing; logic testing; SoC testing; accumulator based structures; deterministic test pattern generator; deterministic test set; encryption modules; functional BIST; functional modules; multipliers; nonintrusive BIST; reseeding strategy; self-testing; systems-on-a-chip; test method; Built-in self-test; Control systems; Costs; Cryptography; Degradation; Digital systems; Hardware; Linear feedback shift registers; System testing; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ
ISSN :
1089-3539
Print_ISBN :
0-7803-6546-1
Type :
conf
DOI :
10.1109/TEST.2000.894259
Filename :
894259
Link To Document :
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