DocumentCode :
2763032
Title :
Holographic pattern testing of printed circuit board (PCB) deformation due to thermal stress
Author :
Taniguchi, Masanari ; Takagi, Tasuku
Author_Institution :
Fac. of Sci. & Technol., Meijo Univ., Nagoya, Japan
fYear :
1989
fDate :
26-28 Apr 1989
Firstpage :
272
Lastpage :
275
Abstract :
A holographic pattern measuring system (HPMS) is used to measure the deformation of a PCB (printed circuit board) due to thermal stress. A quantitative displacement of the PCB surface can be measured by analyzing the holographic pattern. The HPMS combines holography and graphic image processing. The distribution of the microscopic displacement of the PCB surface due to thermal stress can be visualized, and a 3-D graphic image of the deformation can be obtained automatically. Experiments were carried out to the temperature on the PCB surface, the fringe pattern, and the relationship between the deformation and with the width of copper foil on the PCB through which the current flows
Keywords :
holography; printed circuit testing; thermal stresses; 3-D graphic image; PCB surface; copper foil; deformation; fringe pattern; graphic image processing; holographic pattern measuring system; microscopic displacement; printed circuit board; thermal stress; Circuit testing; Displacement measurement; Graphics; Holography; Image processing; Microscopy; Pattern analysis; Printed circuits; Stress measurement; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium, 1989, Proceedings. Japan IEMT Symposium, Sixth IEEE/CHMT International
Conference_Location :
Nara
Type :
conf
DOI :
10.1109/IEMTS.1989.76155
Filename :
76155
Link To Document :
بازگشت